Use of the Talbot effect for measuring the phase-to-amplitude ratio for a gain grating induced in a flashlamp-pumped Nd:YAG crystalIL'ICHEV, N. N; TUMORIN, V. V.Quantum electronics (Woodbury). 2004, Vol 34, Num 3, pp 283-288, issn 1063-7818, 6 p.Article

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Aberration measurement using axial intensityQIAN GONG; HSU, S. S.Optical engineering (Bellingham. Print). 1994, Vol 33, Num 4, pp 1176-1186, issn 0091-3286Article

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Novel optical techniques for window glass inspectionSAVOLAINEN, M; PEIPONEN, K.-E; SAVANDER, P et al.Measurement science & technology (Print). 1995, Vol 6, Num 7, pp 1016-1021, issn 0957-0233Article

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Long wavelength quantum well detectors : can they compete ?LYON, S. A.Surface science. 1990, Vol 228, Num 1-3, pp 508-513, issn 0039-6028Conference Paper

Analyse de structure des systèmes de mesure optimaux du type interférentielSHCHERBAK, V. I.Radiotehnika (Moskva). 1989, Num 6, pp 69-72, issn 0033-8486Article

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Phase-shifting Moiré deflectometryPFEIFER, T; WANG, B; EVERTZ, J et al.Optik (Stuttgart). 1995, Vol 98, Num 4, pp 158-162, issn 0030-4026Article

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